• Easy operation in high and low vacuum mode facilitates imaging of any material
• Auto-mode particle counting, measuring, and chemical identification requires no user input once initiated

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• Unique detection system provides high contrast for a wide range of samples
• Low vacuum mode allows analysis of insulating samples with no conductive coating

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• High resolution imaging to the nanoscale with multiple detectors for topographic and compositional material information
• High flexibility in loading samples gives additional options for analyses

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• Nanometer level imaging and elemental analysis
• Variable accelerating voltage can be customized to suit sample sensitivity

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• Atomic resolution imaging and elemental analysis
• Customized fittings available to perform in situ dynamic experiments in real time

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• Single atom resolution imaging and elemental analysis
• Spherical aberration corrected for the highest spatial resolution

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