Archives

ZSX Primus IV XRF Spectrometer

  • Quick analysis of the major and minor elements (ppm)
  • Qualitative and quantitative determination from boron to uranium
  • Mapping and multi-point measurements

FLYER

 

SmartLab X-ray Diffraction System

  • Crystal structure of thin films, powders, and bulks
  • High power rotating anode and 2D detector
  • 10+ modes of analysis, i.e. GIXRD, XRR, residual stress, in-situ, and more

FLYER