- X-ray computed tomography with sub-50 nm resolution
- Excillum MetalJet source with continuously regenerated, high-power liquid-metal jets
- Produces 3D data non-destructively allowing unparalleled insight into internal material structure and sample analysis
Archives
Smartzoom 5
- Automated digital microscope for QC and failure analysis
- 2D and 3D imaging and measurement
Smartproof 5
- Laser scanning confocal microscope for surface topography measurements
- Allows for 10nm vertical resolution
Orion Nanofab
- Focus ion beam (FIB) microscope with helium and neon beams
- Imaging resolution down to 5 angstroms and sub-10nm material removal
Crossbeam 340 w/ Laser
- Scanning electron microscope with integrated gallium ion beam allowing nanometer precision material removal
- Capable of 3D nanotomography, nanofabrication, and precise analytical analysis
Xradia MicroCT 400
- X-ray computer tomography system
- Complements Xradia Versa with lower energy limit, best suited for less dense materials
Xradia Versa 520
- X-ray computed tomography with submicron resolution
- Produces 3D data non-destructively allowing unparalleled insight into internal material structure and sample analysis